Name
Abstract | ||
|---|---|---|
The inherent fault-masking characteristic of the traditional loopback test produces overly pessimistic estimates of device-under-test (DUT) performance, which negatively impacts product yield, although the loopback test provides a promising low-cost test solution. The proposed method overcomes the fault-masking shortcomings of the loopback test for single-ended mixed-signal circuits by accurately ... |
Year | DOI | Venue |
|---|---|---|
2014 | 10.1109/TCSII.2014.2312639 | IEEE Transactions on Circuits and Systems II: Express Briefs |
Keywords | Field | DocType |
Radio frequency,Mathematical model,Equations,Testing,Adders,Harmonic analysis,Circuit faults | Phase imbalance,Loopback,Nonlinear system,Adder,Control theory,Electronic engineering,Radio frequency,Harmonic analysis,Mixed-signal integrated circuit,Electronic circuit,Mathematics | Journal |
Volume | Issue | ISSN |
61 | 5 | 1549-7747 |
Citations | PageRank | References |
1 | 0.36 | 13 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Byoungho Kim | 1 | 113 | 14.39 |
| J. Abraham | 2 | 4905 | 608.16 |