Title
3-D stacked die: now or future?
Abstract
The continuation of Moore's law by conventional CMOS scaling is becoming challenging. 3D Packaging with 3D through silicon vias (TSV) interconnects is showing promise for extending scaling using mature silicon technology, providing another path towards the "More than Moore". Two years ago, the big unceasing question was "Why 3D?" Today, as we move forward with the concrete implementation of the technology, the questions are now "When 3D?" and "How 3D?" There are quite a few brave souls who have taken this disruptive interconnect technology and are investing in it today to gain benefit from it. However, for many the lingering questions remain "Are we there yet?" "Is it now or the future?"
Year
DOI
Venue
2010
10.1145/1837274.1837350
DAC
Keywords
Field
DocType
conventional cmos scaling,brave soul,integrated circuits,3-d,silicon vias,big unceasing question,mature silicon technology,concrete implementation,cmos integrated circuits,moore s law,packaging,stacking,cmos technology,integrated circuit,design methodology,integrated circuit packaging,through silicon via,silicon
Electronic engineering,Cmos scaling,Engineering,Interconnect technology,Moore's law
Conference
ISSN
ISBN
Citations 
0738-100X
978-1-4244-6677-1
1
PageRank 
References 
Authors
0.34
1
8
Name
Order
Citations
PageRank
Samta Bansal110.34
Juan C. Rey231.62
Andrew Yang3103.74
Myung-Soo Jang430.77
LC Lu510.34
Philippe Magarshack611114.88
Pol Marchal7788.43
Riko Radojcic8314.68