Title
An Analysis of Leakage Factors for Dual-Rail Pre-Charge Logic Style
Abstract
In recent years, certain countermeasures against differential power analysis (DPA) at the logic level have been proposed. Recently, Popp and Mangard proposed a new countermeasure-masked dual-rail pre-charge logic (MDPL); this countermeasure combines dual-rail circuits with random masking to improve the wave dynamic differential logic (WDDL). They claimed that it could implement secure circuits using a standard CMOS cell library without special constraints for the place-and-route method because the difference between the loading capacitances of all the pairs of complementary logic gates in MDPL can be compensated for by the random masking. In this paper, we particularly focus on the signal transition of MDPL gates and evaluate the DPA-resistance of MDPL in detail. Our evaluation results reveal that when the input signals have different delay times, leakage occurs in the MDPL as well as WDDL gates, even if MDPL is effective in reducing the leakage caused by the difference in loading capacitances. Furthermore, in order to validate our evaluation, we demonstrate a problem with different input signal delays by conducting measurements for an FPGA.
Year
DOI
Venue
2008
10.1093/ietfec/e91-a.1.184
IEICE Transactions
Keywords
Field
DocType
leakage factors,different input signal delay,random masking,dual-rail circuit,different delay time,mdpl gate,differential power analysis,complementary logic gate,wave dynamic differential logic,wddl gate,dual-rail pre-charge logic style,logic level,logic gate,place and route,side channel attacks
Logic gate,Pass transistor logic,Signal transition,AND-OR-Invert,Field-programmable gate array,CMOS,Logic level,Logic family,Electrical engineering,Mathematics
Journal
Volume
Issue
ISSN
E91-A
1
0916-8508
Citations 
PageRank 
References 
5
0.46
8
Authors
2
Name
Order
Citations
PageRank
Daisuke Suzuki130621.80
Minoru Saeki224314.88