Paper Info
Title
An intelligent software-integrated environment of IC test
Abstract
The migration and simulation of IC test programs among the heterogeneous ATE systems are a very difficult task. An unifying IC test software-integrated environment from simulation to test for digital circuit has been developed. The environment, TeDS which is designed by using object-oriented paradigm, supports two kinds of CAD systems and three kinds of ATE (Automatic Test Equipment). The paper focuses on issues and techniques in developing TeDS based on object-oriented paradigm
Year
DOI
Venue
1994
10.1109/TEST.1994.528004
ITC
Keywords
Field
DocType
ic test,cad,integrated circuit testing,intelligent software-integrated environment,digital circuit,ic testing,automatic test software,teds,test program,automatic test equipment,software-integrated environment,object-oriented paradigm,digital integrated circuits,ate,simulation,circuit cad,file organisation,heterogeneous ate system,unifying ic test,integrated circuit,difficult task,heterogeneous ate systems,cad system,electronic engineering computing,integrated software,object-oriented methods,software testing,digital circuits,software integration,system testing,design automation
CAD,Digital electronics,Computer architecture,Automatic test equipment,System testing,Computer science,Software,Electronic design automation,Cad system,Integrated software,Embedded system
Conference
ISSN
ISBN
Citations 
1089-3539
0-7803-2103-0
0
PageRank 
References 
Authors
0.34
7
3
Name
Order
Citations
PageRank
Yuning Sun100.68
Xiaoming Wang200.34
Wanchun Shi301.35