Name
Year | DOI | Venue |
|---|---|---|
2012 | 10.1109/ESSDERC.2012.6343380 | ESSDERC |
Keywords | Field | DocType |
integrated circuits,field effect transistors,dielectric properties | Wafer,Graphene,Microelectronics,Field-effect transistor,Electronic engineering,Transistor,Materials science,Integrated circuit,Shallow trench isolation,Wafer-scale integration | Conference |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
9 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Sam Vaziri | 1 | 0 | 1.69 |
| Anderson D. Smith | 2 | 0 | 1.35 |
| Christoph Henkel | 3 | 0 | 0.68 |
| Mikael Östling | 4 | 1 | 3.36 |
| Max C. Lemme | 5 | 18 | 3.57 |
| Grzegorz Lupina | 6 | 0 | 1.01 |
| Gunther Lippert | 7 | 0 | 0.34 |
| Jarek Dabrowski | 8 | 0 | 0.34 |
| Wolfgang Mehr | 9 | 0 | 0.34 |