Title
Inserting a low-temperature n-GaN underlying layer to separate nonradiative recombination centers improves the luminescence efficiency of blue InGaN/GaN LEDs
Abstract
We have investigated the effects of nonradiative recombination centers (NRCs) on the device performance of InGaN/GaN multi-quantum-well (MQW) light-emitting diodes (LEDs) inserting low-temperature n-GaN (LT-GaN) underlying layers. Inserting an LT-GaN underlying layer prior to growing the MQWs is a successful means of separating the induced nonradiative recombination centers because a growth interrupt interface exists between the n-GaN template and the InGaN QW. We found that by introducing this technique would improve the external quantum efficiency of the as-grown conventional LEDs. The electroluminescence relative intensity of a blue LED incorporating a 70-nm-thick LT-GaN was 20.6% higher (at 20mA current injection) than that of the corresponding as-grown blue LED in the best case.
Year
DOI
Venue
2010
10.1016/j.microrel.2010.01.017
Microelectronics Reliability
Keywords
Field
DocType
external quantum efficiency,electroluminescence,light emitting diode
Quantum efficiency,Recombination,Diode,Luminescence,Electronic engineering,Engineering,Light-emitting diode,Optoelectronics,Electroluminescence
Journal
Volume
Issue
ISSN
50
5
0026-2714
Citations 
PageRank 
References 
1
0.38
0
Authors
9
Name
Order
Citations
PageRank
Ray-Ming Lin110.38
Yung-Hsiang Lin270.83
Chung-Hao Chiang310.38
Mu-Jen Lai451.82
Yi-Lun Chou510.38
Yuan-Chieh Lu610.38
Shou-Yi Kuo710.72
Bor-Ren Fang810.38
Meng-Chyi Wu952.98