Name
Year | DOI | Venue |
|---|---|---|
2013 | 10.1016/j.microrel.2012.11.005 | Microelectronics Reliability |
Field | DocType | Volume |
Three-dimensional integrated circuit,Engineering,Reliability engineering | Journal | 53 |
Issue | ISSN | Citations |
1 | 0026-2714 | 2 |
PageRank | References | Authors |
0.71 | 0 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| C. Robert Kao | 1 | 2 | 1.05 |
| Albert T. Wu | 2 | 2 | 1.05 |
| King-Ning Tu | 3 | 54 | 7.11 |
| Yi-Shao Lai | 4 | 172 | 46.81 |