Name
Abstract | ||
|---|---|---|
As complex very-large-scale integration circuit testing using external automatic test equipment is becoming increasingly expensive, built-in self-test (BIST) is an alternative technique that can significantly reduce the cost of testing. On the other hand, artificial immune systems have been considered as one of the most promising nature-inspired techniques used for novelty detection systems. One o... |
Year | DOI | Venue |
|---|---|---|
2008 | 10.1109/TIM.2008.919002 | IEEE Transactions on Instrumentation and Measurement |
Keywords | Field | DocType |
Circuit testing,Detectors,Built-in self-test,Immune system,Performance evaluation,Electrical fault detection,Fault detection,Very large scale integration,Automatic test equipment,Costs | Artificial immune system,Novelty detection,Automatic test equipment,Fault detection and isolation,Electronic engineering,Aliasing,Very-large-scale integration,Detector,Mathematics,Built-in self-test | Journal |
Volume | Issue | ISSN |
57 | 9 | 0018-9456 |
Citations | PageRank | References |
1 | 0.39 | 7 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Cleonilson Protásio de Souza | 1 | 7 | 2.28 |
| Francisco Marcos de Assis | 2 | 3 | 3.97 |
| Raimundo Carlos Silvério Freire | 3 | 13 | 6.97 |