Name
Abstract | ||
|---|---|---|
High defect density and extreme process variation for nanoscale self-assembled crossbar-based architectures have been expected to be as fundamental design challenges. Consequently, defect and variation issues must be considered on logic mapping on nanoscale crossbars. In this paper, we investigate a greedy algorithm for the variation and defect aware logic mapping of crossbar arrays. Based on Mont-Carlo simulation, we compare the proposed technique with other logic mapping techniques such as variation unaware and exhaustive search mapping in terms of accuracy as well as runtime. |
Year | DOI | Venue |
|---|---|---|
2010 | 10.1109/ISVLSI.2010.43 | ISVLSI |
Keywords | Field | DocType |
variation issues,mont-carlo simulation,logic mapping technique,extreme process variation,design mapping,nanoscale crossbar,exhaustive search mapping,reconfigurable nanoscale crossbars,nanoscale self-assembled crossbar-based architecture,defect aware logic mapping,high defect density,variation issue,logic mapping,nanowires,variation,greedy algorithms,exhaustive search,defect,process variation,logic design,logic circuits,monte carlo methods,bipartite graph,greedy algorithm,monte carlo simulation | Logic synthesis,Logic gate,Nanoscopic scale,Brute-force search,Computer science,Greedy algorithm,Electronic engineering,Process variation,Logic mapping,Computer engineering,Crossbar switch | Conference |
ISSN | Citations | PageRank |
2159-3469 | 3 | 0.39 |
References | Authors | |
0 | 4 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Behnam Ghavami | 1 | 85 | 18.98 |
| Alireza Tajary | 2 | 6 | 2.80 |
| Mohsen Raji | 3 | 40 | 11.25 |
| Hossein Pedram | 4 | 190 | 32.47 |