Name
Abstract | ||
|---|---|---|
An automated lifetest equipment, recently proposed, has been developed and tested. Its main feature is the capability of monitoring long term degradations and to ensure sub-second sampling of the relevant data during sudden and fast events. The availability of other automated functions, as the programmable recording of voltage-current and optical power-current characteristics, makes the instrument ideal for automatic managing of a whole lifetest. Failure Analysis of suddenly failing devices is then enabled and demonstrated. (C) 2002 Elsevier Science Ltd. All rights reserved. |
Year | DOI | Venue |
|---|---|---|
2002 | 10.1016/S0026-2714(02)00141-5 | Microelectronics Reliability |
Field | DocType | Volume |
Engineering,Reliability engineering | Journal | 42 |
Issue | ISSN | Citations |
9 | 0026-2714 | 1 |
PageRank | References | Authors |
0.41 | 0 | 5 |