Name
Title | ||
|---|---|---|
8Gbps CMOS pin electronics hardware macro with simultaneous bi-directional capability |
Abstract | ||
|---|---|---|
In this paper, we present a small sized CMOS pin-electronics hardware macro applicable to 8Gbps real-time functional testing. The macro includes a driver, comparators, DACs, and control logic embedded within an area of size 2mm 脳 1.6mm. As the macro is implemented on a 65nm standard CMOS process, it can be implemented together with pattern generators and timing generators to realize a single chip pin electronics solution. Moreover, the macro is capable of simultaneous bi-directional (SBD) signaling, which greatly reduces test time. A simple and reliable method to evaluate SBD is also discussed. We have applied our macro to a test chip to prove that the macro is applicable to an 8Gbps test system. |
Year | DOI | Venue |
|---|---|---|
2012 | 10.1109/TEST.2012.6401543 | ITC |
Keywords | DocType | Citations |
test system,CMOS pin electronics hardware,test time,reliable method,pattern generator,control logic,test chip,real-time functional testing,single chip pin electronics,CMOS pin-electronics hardware macro,simultaneous bi-directional capability,standard CMOS process | Conference | 1 |
PageRank | References | Authors |
0.38 | 0 | 7 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Atsushi Ono | 1 | 1 | 0.38 |
| Ken-ichi Sawada | 2 | 1 | 0.38 |
| Daisuke Watanabe | 3 | 14 | 4.42 |
| Tasuku Fujibe | 4 | 1 | 1.05 |
| Tsuyoshi Ataka | 5 | 1 | 0.38 |
| Yasuyuki Arai | 6 | 1 | 0.38 |
| Shoji Kojima | 7 | 4 | 1.94 |