Name
Abstract | ||
|---|---|---|
A comprehensive framework for the metrological characterization of timebase jitter in waveform digitizers is proposed. With this aim, the Allan variance is shown to be a sound basis for defining a suitable figure of merit, setting up an experimental test procedure, diagnosing the jitter noise type, and modeling the jitter error. Experimental results highlighting the effectiveness of the Allan variance in the metrological characterization of digitizer jitter are discussed. |
Year | DOI | Venue |
|---|---|---|
2003 | 10.1016/S0920-5489(02)00074-0 | Computer Standards & Interfaces |
Keywords | Field | DocType |
experimental test procedure,digitizer jitter,metrological characterization,comprehensive framework,digitizer timebase jitter,timebase jitter,allan variance,sound basis,jitter error,jitter noise type,figure of merit,testing,jitter,modeling | Allan variance,Computer science,Metrology,Waveform,Electronic engineering,Real-time computing,Figure of merit,Jitter,Statistics,Test procedures | Journal |
Volume | Issue | ISSN |
25 | 1 | 0920-5489 |
Citations | PageRank | References |
5 | 0.82 | 5 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Pasquale Arpaia | 1 | 95 | 29.77 |
| Daponte, P. | 2 | 247 | 49.35 |
| Sergio Rapuano | 3 | 186 | 31.76 |