Title
Practical modeling and acquisition of layered facial reflectance
Abstract
We present a practical method for modeling layered facial reflectance consisting of specular reflectance, single scattering, and shallow and deep subsurface scattering. We estimate parameters of appropriate reflectance models for each of these layers from just 20 photographs recorded in a few seconds from a single viewpoint. We extract spatially-varying specular reflectance and single-scattering parameters from polarization-difference images under spherical and point source illumination. Next, we employ direct-indirect separation to decompose the remaining multiple scattering observed under cross-polarization into shallow and deep scattering components to model the light transport through multiple layers of skin. Finally, we match appropriate diffusion models to the extracted shallow and deep scattering components for different regions on the face. We validate our technique by comparing renderings of subjects to reference photographs recorded from novel viewpoints and under novel illumination conditions.
Year
DOI
Venue
2008
10.1145/1457515.1409092
ACM Trans. Graph.
Keywords
Field
DocType
novel illumination condition,appropriate diffusion model,appropriate reflectance model,single scattering,practical modeling,deep scattering component,remaining multiple scattering,multiple layer,layered facial reflectance,deep subsurface scattering,specular reflectance,point source,diffusion model,texture compression,cross polarization,specular reflection,subsurface scattering,surface texture
Computer vision,Texture compression,Computer science,Specular reflection,Optics,Point source,Surface finish,Scattering,Artificial intelligence,Rendering (computer graphics),Reflectivity,Subsurface scattering
Journal
Volume
Issue
Citations 
27
5
48
PageRank 
References 
Authors
1.87
23
5
Name
Order
Citations
PageRank
Abhijeet Ghosh177258.87
Tim Hawkins245128.27
Pieter Peers3110955.34
Sune Frederiksen4562.30
Paul Debevec54955449.10