Name
Year | DOI | Venue |
|---|---|---|
1993 | 10.1109/ICCD.1993.393391 | ICCD |
Keywords | Field | DocType |
register transfer level,logic design,high level synthesis,fault coverage,integer programming,cost estimation,random testing,design for testability,system testing,controllability | Testability,Design for testing,Random testing,Fault coverage,System testing,Computer science,High-level synthesis,Scan chain,Algorithm,Real-time computing,Test compression | Conference |
Citations | PageRank | References |
5 | 0.53 | 6 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Scott Chiu | 1 | 199 | 16.59 |
| Christos A. Papachristou | 2 | 339 | 39.72 |