Abstract | ||
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A new method based on an optics model for highly reliable surface inspection of industrial parts has been developed. This method uses multiple images taken under different camera conditions. Phong's model is employed for surface reflection, and then the albedo and the reflection model parameters are estimated by the least squares method. The developed method has advantages over conventional binarization in that it can easily determine the threshold of product acceptability and cope with changes in Light intensity when detecting defects. |
Year | DOI | Venue |
---|---|---|
2000 | 10.1007/s001380050137 | Mach. Vis. Appl. |
Keywords | Field | DocType |
least square method,visual inspection | Least squares,Computer vision,Visual inspection,Surface reflection,Computer graphics (images),Computer science,Optics,Albedo,Phong reflection model,Artificial intelligence,Tessellation | Journal |
Volume | Issue | ISSN |
12 | 4 | 0932-8092 |
Citations | PageRank | References |
3 | 0.46 | 4 |
Authors | ||
4 |
Name | Order | Citations | PageRank |
---|---|---|---|
Norifumi Katafuchi | 1 | 5 | 1.41 |
Mutsuo Sano | 2 | 42 | 11.24 |
Shuichi Ohara | 3 | 21 | 2.51 |
Masashi Okudaira | 4 | 18 | 2.20 |