Name
Abstract | ||
|---|---|---|
A new efficient march test algorithm for detecting the 3-coupling faults in Random Access Memories (RAM) is given in this paper. To reduce the length of the test algorithm only the 3-coupling faults between physically adjacent memory cells have been considered. The proposed test algorithm needs 38N operations. We have proved, using an Eulerian graph model, that the algorithm detects all non-interacting coupling faults. This paper also comprises a study about the ability of the algorithm to cover the interacting coupling faults. |
Year | DOI | Venue |
|---|---|---|
2001 | 10.1016/S0141-9331(00)00103-4 | Microprocessors and Microsystems |
Keywords | Field | DocType |
Memory testing,Functional faults,Coupling faults,March test,Fault injection | Stuck-at fault,Coupling,Fault coverage,Computer science,Parallel computing,Eulerian path,Fault (power engineering),Fault injection,Random access,Fault indicator | Journal |
Volume | Issue | ISSN |
24 | 10 | 0141-9331 |
Citations | PageRank | References |
5 | 0.55 | 8 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| P. Caşcaval | 1 | 8 | 1.65 |
| S. Bennett | 2 | 5 | 0.55 |