Title
Fabrication and testing of a novel silicon probe for micromachined surface profilers.
Abstract
In this paper, we present the fabrication and testing of a novel probe for micromechanical surface profiler with double-ended tuning forks (DETFs) resonator as the displacement-sensing element. The probe is fabricated through the standard silicon-on-glass process developed by Peking University. The frequency variation of the DETF caused by the induced axial stress is directly proportional to the input displacement. Two stages micro-leverage mechanisms are introduced for force amplification to increase the overall sensitivity. The experimental results indicate the device has a nominal resonant frequency of 54.5 kHz under atmosphere at room temperature and the overall sensitivity is approximately 359.7 Hz/μm, which shows a good agreement with the simulation value of 330 Hz/μm using ANSYS™. Furthermore, the testing results depict the variation of frequency is linear to the displacement load within the range of 10μm. © 2011 IEEE.
Year
DOI
Venue
2011
10.1109/NEMS.2011.6017378
NEMS
Keywords
Field
DocType
bonding,displacement measurement,double-ended-tuning-forks (detfs) resonator,microleverage,silicon-glass,micromachining,room temperature,process development,vibrations,resonant frequency,glass,silicon
Cylinder stress,Atmosphere,Analytical chemistry,Composite material,Surface micromachining,Resonator,Vibration,Tuning fork,Materials science,Fabrication,Silicon
Conference
Volume
Issue
Citations 
null
null
0
PageRank 
References 
Authors
0.34
1
5
Name
Order
Citations
PageRank
Senlin Jiang110.96
Dacheng Zhang23212.02
Longtao Lin322.21
Zhenchuan Yang42312.18
Guizhen Yan53412.22