Title | ||
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A probabilistic approach to evaluate the reliability of piezoelectric micro-actuators |
Abstract | ||
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In this paper, a probabilistic design approach is presented to evaluate the reliability of piezoelectric micro actuators. Based on the relationship between the lifetime, and degradation mechanism of piezoelectric actuators, and the electric field strength, the concept of "electric strength" is proposed to indicate the electric field strength of the piezoelectric actuators at a specified lifetime. ... |
Year | DOI | Venue |
---|---|---|
2005 | 10.1109/TR.2004.842089 | IEEE Transactions on Reliability |
Keywords | Field | DocType |
Microactuators,Piezoelectric actuators,Fatigue,Life estimation,Probability density function,Stress,Probability distribution,Voltage,Weibull distribution | Probabilistic design,Electric field,Electrical load,Mechanical engineering,Electronic engineering,Interference (wave propagation),Probabilistic logic,Mathematics,Reliability engineering,Actuator,Positioning system,Piezoelectricity | Journal |
Volume | Issue | ISSN |
54 | 1 | 0018-9529 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
3 |
Name | Order | Citations | PageRank |
---|---|---|---|
Zhimin He | 1 | 536 | 35.90 |
Han Tong Loh | 2 | 245 | 17.73 |
Eng Hong Ong | 3 | 2 | 1.12 |