Name
Abstract | ||
|---|---|---|
We demonstrate that narrow-band tuned circuits may be used for ESD protection of RF inputs, and a figure of merit for optimization of these circuits is presented. The performance of the ESD-protected RF circuit is dependent on the quality factor of the ESD device, and various protection devices are evaluated in this work. Record-breaking human body model (HBM) protection levels, exceeding 5 kV, have been achieved without significantly degrading the RF performance at 5 GHz. Broadband circuit protection is also addressed. |
Year | DOI | Venue |
|---|---|---|
2005 | 10.1016/j.microrel.2004.05.012 | Microelectronics Reliability |
Keywords | Field | DocType |
inductors,figure of merit,quality factor,q factor,capacitance,power electronics,shunt electrical,radio frequency,electrostatic discharge | Q factor,Electrostatic discharge,Inductor,Broadband,Figure of merit,Radio frequency,Electronic engineering,Power electronics,Engineering,Electronic circuit,Electrical engineering | Journal |
Volume | Issue | ISSN |
45 | 2 | 0026-2714 |
Citations | PageRank | References |
7 | 2.03 | 1 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Sami Hyvonen | 1 | 14 | 3.23 |
| Sopan Joshi | 2 | 9 | 2.86 |
| Elyse Rosenbaum | 3 | 61 | 21.99 |