Abstract | ||
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Precise knowledge of the longest sensitizable paths in a circuit is crucial for various tasks in computer-aided design, including timing analysis, performance optimization, delay testing, and speed binning. As delays in today's nanoscale technologies are increasingly affected by statistical parameter variations, there is significant interest in obtaining sets of paths that are within a length range. For instance, such path sets can be used in the emerging areas of Post-silicon validation and characterization and Adaptive Test. We present an ASP-based method for computing well-defined sets of sensitizable paths within a length range. Unlike previous approaches, the method is accurate and does not rely on a priori relaxations. Experimental results demonstrate the applicability and scalability of our method. |
Year | DOI | Venue |
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2013 | 10.1007/978-3-642-40564-8_10 | Lecture Notes in Computer Science |
Field | DocType | Volume |
Statistical parameter,Automatic test pattern generation,Computer science,A priori and a posteriori,Algorithm,Theoretical computer science,Static timing analysis,Computerized adaptive testing,Answer set programming,Computation,Scalability | Conference | 8148 |
ISSN | Citations | PageRank |
0302-9743 | 1 | 0.35 |
References | Authors | |
10 | 6 |
Name | Order | Citations | PageRank |
---|---|---|---|
Benjamin Andres | 1 | 43 | 4.56 |
Matthias Sauer | 2 | 195 | 20.02 |
Martin Gebser | 3 | 1909 | 90.30 |
Tobias Schubert | 4 | 598 | 37.74 |
Bernd Becker | 5 | 855 | 73.74 |
Torsten Schaub | 6 | 3150 | 191.50 |