Paper Info
Title
Wearout estimation using the Robustness Validation methodology for components in 150 degreeC ambient automotive applications
Abstract
AEC-Q100 is the usual qualification reference for automotive ICs dedicated to applications up to 125 degrees C ambient temperature. Although qualification criteria have been defined which enable the qualification extension up to 150 degrees C, this might always not satisfy the requirements of automotive Zero Defect policy. The mission profile might for instance exceed the scope of AEC-Q100 verifications, or it might be impossible to predict when the wearout period will start depending on use, having gained very little knowledge of the degradation kinetics. This study provides a concrete analysis of potential customer exposure to wearout failure mechanisms based on the principles developed in SAE J1879 [1], Handbook for Robustness Validation of Semiconductor Devices in Automotive Application. (C) 2010 Elsevier Ltd. All rights reserved.
Year
DOI
Venue
2010
10.1016/j.microrel.2010.07.076
MICROELECTRONICS RELIABILITY
DocType
Volume
Issue
Journal
50
SP9-11
ISSN
Citations 
PageRank 
0026-2714
0
0.34
References 
Authors
0
4
Name
Order
Citations
PageRank
Pascal Lecuyer100.68
Hélène Frémont22012.71
Jean-Pierre Landesman300.68
Manoubi Auguste Bahi400.68