Title
Fault Diagnosis Using an Enhanced Relevance Vector Machine (RVM) for Partially Diagnosable Multistation Assembly Processes
Abstract
Dimensional integrity has a significant impact on the quality of the final products in multistation assembly processes. A large body of research work in fault diagnosis has been proposed to identify the root causes of the large dimensional variations on products. These methods are based on a linear relationship between the dimensional measurements of the products and the possible process errors, and assume that the number of measurements is greater than that of process errors. However, in practice, the number of measurements is often less than that of process errors due to economical considerations. This brings a substantial challenge to the fault diagnosis in multistation assembly processes since the problem becomes solving an underdetermined system. In order to tackle this challenge, a fault diagnosis methodology is proposed by integrating the state space model with the enhanced relevance vector machine (RVM) to identify the process faults through the sparse estimate of the variance change of the process errors. The results of case studies demonstrate that the proposed methodology can identify process faults successfully.
Year
DOI
Venue
2013
10.1109/TASE.2012.2214383
Automation Science and Engineering, IEEE Transactions
Keywords
Field
DocType
assembling,fault diagnosis,learning (artificial intelligence),process monitoring,product quality,production engineering computing,state-space methods,dimensional integrity,enhanced relevance vector machine,fault diagnosis,final product quality,partially diagnosable multistation assembly processes,process errors,product dimensional measurements,state space model,variance,Enhanced relevance vector machine (RVM),fault diagnosis,multistation assembly processes,partially diagnosable,sparse solution
Underdetermined system,Computer science,State-space representation,Artificial intelligence,Relevance vector machine,Machine learning
Journal
Volume
Issue
ISSN
10
1
1545-5955
Citations 
PageRank 
References 
1
0.35
0
Authors
5
Name
Order
Citations
PageRank
Kaveh Bastani1131.05
Zhenyu Kong241.22
Wenzhen Huang341.56
Xiaoming Huo415724.83
Yingqing Zhou510.35