Title
Phase-Noise Driven System Design of Fractional-N Frequency Synthesizers and Validation With Measured Results
Abstract
Phase noise has been a primary issue in the design of frequency synthesizers. The system level noise analysis of a fractional-N (frac-N) PLL is presented to enable the circuit design of a 5-Mbps GMSK modulated data transmitter in the 900 MHz ISM band. A mathematical model describes the noise contributions due to the charge pump (CP), the phase frequency detector (PFD), the loop filter, the VCO, and the delta-sigma modulator. The model takes into account the effects of DeltaSigma modulated CP pulse-widths on its thermal and flicker noise. The DeltaSigma sequence noise caused by static CP current mismatch, CP dynamic mismatch and PFD reset delay mismatch is taken into consideration in the noise analysis. Relying on a combined time-domain and frequency-domain noise analysis, the behavioral model provides fast and accurate phase noise estimation at the system level. This analysis enables the designer to determine the dominant contributors to the in-band and out-of-band phase noise simplifying the transistor level design of frac-N synthesizers. Measured results of a MASH-12 frac-N synthesizer designed in 1.8V TSMC 0.18mum mixed signal/RF process correlate well with behavioral noise model predictions. The proposed system noise analysis methodology has general applicability to frac-N PLL design.
Year
DOI
Venue
2007
10.1109/ISVLSI.2007.82
Porto Alegre
Keywords
Field
DocType
measured results,fractional-n frequency synthesizers,phase-noise driven system design,lower mac processing,physical layer,concurrent multiple wireless protocol,area-efficient solution,scalable communications core,programmable accelerator,frequency domain,behavior modeling,charge pump,network synthesis,time domain,frequency synthesizer,vco,phase noise,phase locked loops,mathematical model,out of band,circuit design,delta sigma modulator,flicker noise,delta modulation,system design
Phase-locked loop,Low-noise amplifier,Flicker noise,Noise (electronics),Phase noise,Noise figure,Noise temperature,Electronic engineering,Effective input noise temperature,Engineering
Conference
ISSN
ISBN
Citations 
2159-3469
0-7695-2896-1
0
PageRank 
References 
Authors
0.34
5
4
Name
Order
Citations
PageRank
Himanshu Arora1779.54
Nikolaus Klemmer2226.52
Thomas Jochum301.01
Patrick Wolf4256.72