Title
A transmission gate physical unclonable function and on-chip voltage-to-digital conversion technique
Abstract
A physical unclonable function (PUF) is an embedded integrated circuit (IC) structure that is designed to leverage naturally occurring variations to produce a random bitstring. In this paper, we evaluate a PUF which leverages resistance variations which occur in transmission gates (TGs) of ICs. We also investigate a novel on-chip technique for converting the voltage drops produced by TGs into a digital code, i.e., a voltage-to-digital converter (VDC). The analysis is carried out on data measured from chips subjected to temperature variations over the range of -40°C to +85°C and voltage variations of +/- 10% of the nominal supply voltage. The TG PUF and VDC produce high quality bitstrings that perform exceptionally well under statistical metrics including stability, randomness and uniqueness.
Year
DOI
Venue
2013
10.1145/2463209.2488806
Design Automation Conference
Keywords
Field
DocType
high quality bitstrings,transmission gate physical unclonable,voltage variation,on-chip voltage-to-digital conversion technique,digital code,random bitstring,physical unclonable function,embedded integrated circuit,novel on-chip technique,nominal supply voltage,resistance variation,tg puf,hardware security,integrated circuit design,unique identifier
Hardware security module,Computer science,Voltage,Voltage drop,Electronic engineering,Integrated circuit design,Transmission gate,Physical unclonable function,Integrated circuit,Electrical engineering,Randomness
Conference
ISSN
Citations 
PageRank 
0738-100X
5
0.48
References 
Authors
9
4
Name
Order
Citations
PageRank
Raj Chakraborty1111.02
Charles Lamech2282.27
Dhruva Acharyya3828.56
James F. Plusquellic410915.02