Title
Thermal simulation techniques for nanoscale transistors
Abstract
Thermal simulations are important for advanced electronic systems at multiple length scales. A major challenge involves electrothermal phenomena within nanoscale transistors, which exhibit nearly ballistic transport both for electrons and phonons. The thermal device behavior can influence both the mobility and the leakage currents. We discuss recent advances in modeling coupled electron-phonon transport in future nanoscale transistors. The solution techniques involve solving the Boltzmann transport equation (BTE) for both electrons and phonons. We present a practical method for coupling an electron Monte Carlo simulation with an analytic "split-flux" form of the phonon BTE. We use this approach to model self-heating in a 20 nm quasi-ballistic n+/n/n+ silicon diode, and to investigate the role of hot electron and hot phonon transport.
Year
DOI
Venue
2005
10.1109/ICCAD.2005.1560068
ICCAD
Keywords
Field
DocType
thermal analysis,boltzmann transport equation,ballistic transport,monte carlo methods,silicon,boltzmann equation,leakage current,nanoelectronics,monte carlo simulation,length scale
Nanoelectronics,Monte Carlo method,Boltzmann equation,Leakage (electronics),Computer science,Electronic engineering,Phonon,Transistor,Electron,Ballistic conduction
Conference
ISSN
ISBN
Citations 
1063-6757
0-7803-9254-X
3
PageRank 
References 
Authors
1.16
1
5
Name
Order
Citations
PageRank
Jeremy A. Rowlette131.16
Eric Pop25012.07
Sanjiv Sinha3182.94
Mathew Panzer431.16
Kenneth E. Goodson5435.13