Name
Abstract | ||
|---|---|---|
Presents a functional level built-in self-test of digital filters. This BIST technique is based on predetermined patterns which are not dependent on the filter implementation. Many examples show that stuck-at fault coverage is about 98%.<> |
Year | DOI | Venue |
|---|---|---|
1992 | 10.1109/VTEST.1992.232730 | VTS |
Keywords | Field | DocType |
fir digital filters,predetermined patterns,functional level,built-in self test,digital filters,stuck-at fault coverage,filter implementation,fault location,functional bist approach,fault coverage,robots,automatic test pattern generation,finite impulse response filter,digital filter,registers | Automatic test pattern generation,Digital filter,Fault coverage,Impulse testing,Computer science,Test pattern generators,Real-time computing,Electronic engineering,Finite impulse response,Robot,Built-in self-test | Conference |
ISBN | Citations | PageRank |
0-7803-0623-6 | 6 | 0.85 |
References | Authors | |
5 | 2 | |