Name
Title | ||
|---|---|---|
Indirect method for random jitter measurement on SoCs using critical path characterization |
Abstract | ||
|---|---|---|
This paper presents a new method for random jitter measurement on systems-on-a-chip (SoCs) by exploiting shmoo plotting in automatic test equipment (ATE). After finding the maximum operating frequency of a microprocessor using functional test patterns that can sensitize its critical paths, the proposed method constructs a cumulative distribution function (CDF) whose standard deviation represents the root mean square (RMS) value of the random jitter of the clock signals used in the microprocessor. By leveraging tester period resolution with a frequency multiplying phase-locked loop (PLL) in the SoC, the shmoo plot with a fine period step size can detect the jitter component in the clock signal, which reflects the actual jitter that most critical paths undergo. The proposed idea was verified with circuit-level simulations, and was validated by silicon measurements using one of the latest SoC products. |
Year | DOI | Venue |
|---|---|---|
2012 | 10.1109/ETS.2012.6233022 | European Test Symposium |
Keywords | Field | DocType |
systems-on-a-chip,silicon measurements,circuit-level simulations,microprocessor chips,jitter,frequency multiplying pll,cdf,microprocessor,automatic test equipment,standard deviation,system-on-chip,clock signals,ate,random jitter measurement,jitter component,root mean square value,frequency multiplying phase-locked loop,cumulative distribution function,rms value,shmoo plotting,soc products,critical path characterization,phase lock loop,critical path,integrated circuit,system on a chip,root mean square,functional testing,phase locked loops,mathematical model,system on chip | Clock signal,Shmoo plot,Phase-locked loop,Computer science,Real-time computing,Electronic engineering,Cumulative distribution function,Root mean square,Jitter,Critical path method,Standard deviation | Conference |
ISSN | ISBN | Citations |
1530-1877 | 978-1-4673-0695-9 | 0 |
PageRank | References | Authors |
0.34 | 10 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jae Wook Lee | 1 | 33 | 8.37 |
| Ji Hwan (Paul) Chun | 2 | 16 | 2.39 |
| J. Abraham | 3 | 4905 | 608.16 |