Name
Abstract | ||
|---|---|---|
A formal analysis of the fault diagnosis capabilities of various FSM-based test sequence selection methods has been carried out^1. It is shown^1 that the Wp-method^2 has the best fault-resolution capability among all the known test sequence selection methods based on the FSM model when the implementation has at most one faulty transition. In this paper, we present a test sequence selection method with a fault resolution capability better than that of the Wp-method when the implementation has at most one faulty transition, and when the specification meets certain conditions. This method is based on the Wp-method. Approaches for minimizing the test sequence further, and for exactly locating the fault or improving the fault resolution capability of our method, are also presented. |
Year | DOI | Venue |
|---|---|---|
1995 | 10.1016/0140-3664(95)96834-D | Computer Communications |
Keywords | DocType | Volume |
fault diagnosis,test sequence selection,FSM model | Journal | 18 |
Issue | ISSN | Citations |
5 | Computer Communications | 9 |
PageRank | References | Authors |
0.63 | 14 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| T. Ramalingam | 1 | 13 | 1.76 |
| Anindya Das | 2 | 219 | 31.78 |
| Krishnaiyan Thulasiraman | 3 | 315 | 31.10 |