Title
ProTest: a low cost rapid prototyping and test system for ASICs and FPGAs.
Abstract
The test bench methodology helps the design engineer to structure the simulation of his circuit. As showed in this paper, the test bench methodology can further be developed in order to efficiently reuse simulation stimuli and response for the real device under test. As FPGAs are very often used to prototype an ASIC design, an easy switch between simulation and real hardware test is necessary to establish a rapid prototyping design and test environment. Our ProTest system closes the gap between the simulation and the test environment with a low-cost and easy to use computer-aided-test environment. The ProTest system consists of three parts: an interface to different HDL based CAD-tools, a Computer-Aided-Test tool written in the Java programming language and a low-cost hardware test machine.
Year
DOI
Venue
1997
10.1109/ATS.1997.643949
Asian Test Symposium
Keywords
Field
DocType
test bench methodology,test environment,reuse simulation stimulus,low-cost hardware test machine,design engineer,real hardware test,protest system,rapid prototyping,rapid prototyping design,test system,computer-aided-test environment,asic design,low cost,simulation,application specific integrated circuits,switches,system testing,fpga,logic design,prototypes,device under test,field programmable gate arrays,vlsi,computational modeling,asic,design methodology
Rapid prototyping,Design engineer,Device under test,Test bench,Computer science,Software prototyping,Field-programmable gate array,FPGA prototype,Application-specific integrated circuit,Embedded system
Conference
ISBN
Citations 
PageRank 
0-8186-7996-4
0
0.34
References 
Authors
1
5
Name
Order
Citations
PageRank
Marcel Jacomet1287.26
Roger Waelti200.34
Lukas Winzenried300.34
Jaime Perez400.34
Martin Gysel500.34