Title | ||
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A De-Embedding Method Using Different-Length Transmission Lines For Mm-Wave Cmos Device Modeling |
Abstract | ||
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This paper proposes a de-embedding method for on-chip S-parameter measurements at mm-wave frequency. The proposed method uses only two transmission lines with different length. In the proposed method, a parasitic-component model extracted from two transmission lines can be used for de-embedding for other-type DUTs like transistor, capacitor, inductor, etc. The experimental results show that the error in characteristic impedance between the different-length transmission lines is less than 0.7% above 40 GHz. The extracted pad model is also shown. |
Year | DOI | Venue |
---|---|---|
2010 | 10.1587/transele.E93.C.812 | IEICE TRANSACTIONS ON ELECTRONICS |
Keywords | Field | DocType |
de-embedding, S-parameter measurement, mm-wave, RF CMOS, transmission line | Capacitor,Transmission line,Inductor,Electric power transmission,CMOS,Characteristic impedance,Electronic engineering,Scattering parameters,Engineering,Transistor,Electrical engineering | Journal |
Volume | Issue | ISSN |
E93C | 6 | 1745-1353 |
Citations | PageRank | References |
0 | 0.34 | 3 |
Authors | ||
7 |
Name | Order | Citations | PageRank |
---|---|---|---|
Naoki Takayama | 1 | 70 | 8.16 |
Kota Matsushita | 2 | 77 | 9.16 |
Shogo Ito | 3 | 70 | 7.82 |
Ning Li | 4 | 84 | 12.60 |
Keigo Bunsen | 5 | 73 | 7.56 |
Kenichi Okada | 6 | 497 | 100.11 |
Akira Matsuzawa | 7 | 465 | 88.10 |