Title
A De-Embedding Method Using Different-Length Transmission Lines For Mm-Wave Cmos Device Modeling
Abstract
This paper proposes a de-embedding method for on-chip S-parameter measurements at mm-wave frequency. The proposed method uses only two transmission lines with different length. In the proposed method, a parasitic-component model extracted from two transmission lines can be used for de-embedding for other-type DUTs like transistor, capacitor, inductor, etc. The experimental results show that the error in characteristic impedance between the different-length transmission lines is less than 0.7% above 40 GHz. The extracted pad model is also shown.
Year
DOI
Venue
2010
10.1587/transele.E93.C.812
IEICE TRANSACTIONS ON ELECTRONICS
Keywords
Field
DocType
de-embedding, S-parameter measurement, mm-wave, RF CMOS, transmission line
Capacitor,Transmission line,Inductor,Electric power transmission,CMOS,Characteristic impedance,Electronic engineering,Scattering parameters,Engineering,Transistor,Electrical engineering
Journal
Volume
Issue
ISSN
E93C
6
1745-1353
Citations 
PageRank 
References 
0
0.34
3
Authors
7
Name
Order
Citations
PageRank
Naoki Takayama1708.16
Kota Matsushita2779.16
Shogo Ito3707.82
Ning Li48412.60
Keigo Bunsen5737.56
Kenichi Okada6497100.11
Akira Matsuzawa746588.10