Abstract | ||
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A fully integrated fully differential distributed amplifier with 5.5 dB pass-band gain and 8.5 GHz unity-gain bandwidth is described. The fully differential CMOS circuit topology yields wider bandwidth than its single-ended counterpart, by eliminating the source degeneration effects of parasitic interconnect, bond wire, and package inductors. A simulated annealing CAD tool underpins the parasitic-aware methodology used to optimize the design including all on-chip active and passive device and off-chip package parasitics. Mixed-mode S-parameter measurement techniques used for fully differential circuit testing are reviewed. Integrated in 1.3×2.2 mm2 in a standard 0.6 μm CMOS process, the distributed amplifier dissipates 216 mW from a single 3 V supply. |
Year | DOI | Venue |
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2002 | 10.1109/JSSC.2002.800960 | Solid-State Circuits, IEEE Journal of |
Keywords | DocType | Volume |
cmos analogue integrated circuits,5.5 db,package inductor,bond wire,design optimization,source degeneration,0.5 to 8.5 ghz,s-parameters,mixed-mode s-parameter measurement,distributed amplifiers,circuit optimisation,pass-band gain,cad tool,8.5 ghz,0.6 micron,circuit cad,integrated circuit design,parasitic-aware methodology,wideband amplifiers,parasitic interconnect,radiofrequency amplifiers,fully-integrated fully-differential cmos distributed amplifier,simulated annealing,3 v,216 mw,unity-gain bandwidth,gain,packaging,bandwidth,inductors,unity gain bandwidth,s parameters,circuit topology | Journal | 37 |
Issue | ISSN | Citations |
8 | 0018-9200 | 25 |
PageRank | References | Authors |
4.46 | 2 | 2 |
Name | Order | Citations | PageRank |
---|---|---|---|
Hee-Tae Ahn | 1 | 71 | 15.46 |
D. J. Allstot | 2 | 389 | 76.58 |