Name
Abstract | ||
|---|---|---|
In this work we propose a methodology based on a mixed-mode simulation approach to evaluate the impact of finger interruptions in the front-side metallization on the solar cell performance. We apply the proposed methodology to typical finger profiles realized with double screen-printing technology. The efficiency degradation induced by finger interruptions is studied as a function of interruption size, interruption position, number of interruptions and finger resistivity. (C) 2012 Elsevier Ltd. All rights reserved. |
Year | DOI | Venue |
|---|---|---|
2012 | 10.1016/j.microrel.2012.07.014 | MICROELECTRONICS RELIABILITY |
Field | DocType | Volume |
Electronic engineering,Solar cell,Engineering | Journal | 52 |
Issue | ISSN | Citations |
SP9-10 | 0026-2714 | 1 |
PageRank | References | Authors |
0.35 | 0 | 8 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Raffaele De Rose | 1 | 57 | 10.63 |
| A. Malomo | 2 | 1 | 0.35 |
| P. Magnone | 3 | 19 | 5.90 |
| Felice Crupi | 4 | 25 | 8.33 |
| G. Cellere | 5 | 4 | 2.42 |
| M. Martire | 6 | 1 | 0.35 |
| D. Tonini | 7 | 1 | 0.69 |
| Enrico Sangiorgi | 8 | 8 | 4.78 |