Title
Guest Editorial Special Issue on the 2010 IEEE International Instrumentation and Measurement Conference
Abstract
The 46 papers in this special issue were originally presented at the 2010 IEEE International Instrumentation and Measurement Conference, held in Austin, TX, on May 3-6, 2010.
Year
DOI
Venue
2011
10.1109/TIM.2011.2114530
Instrumentation and Measurement, IEEE Transactions
Field
DocType
Volume
Systems engineering,Control engineering,Engineering,Electrical engineering,Instrumentation
Journal
60
Issue
ISSN
Citations 
5
0018-9456
0
PageRank 
References 
Authors
0.34
0
3
Name
Order
Citations
PageRank
Mark Yeary1122.60
Wendy Van Moer29929.63
Van Moer, W.35724.84