Paper Info
Title
A New Solution To Power Supply Voltage Drop Problems In Scan Testing
Abstract
As semiconductor manufacturing technology advances, power dissipation and noise in scan testing have become critical problems. Our studies on practical LSI manufacturing show that power supply voltage drop causes testing problems during shift operations in scan testing. In this paper, we present a new testing method named MD-SCAN (Multi-Duty SCAN) which solves power supply voltage drop problems, as well as its experimental results applied to practical LSI chips.
Year
Venue
Keywords
2004
IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS
power supply voltage drop, noise, low power, scan test, clock duty
Field
DocType
Volume
Computer vision,Computer science,Voltage drop,Artificial intelligence,Power supply rejection ratio,Electrical engineering,Switched-mode power supply,Embedded system
Journal
E87D
Issue
ISSN
Citations 
3
1745-1361
0
PageRank 
References 
Authors
0.34
0
2
Name
Order
Citations
PageRank
Takaki Yoshida1252.32
Masafumi Watari2435.09