Title
An Improved KNN Algorithm of Intelligent Built-in Test.
Abstract
Aimed at the faults of K-nearest neighbor (KNN) algorithm in complex equipment's built-in test (BIT), an improved KNN (IKNN) algorithm is proposed to solve the problem from two aspects. Firstly, the weight of each input feature is learned using neural network to make important features contribute more in the classifications; this improves the precision of classification. Secondly, clustering each sample of the training set to reduce the data volume of training set, this improves the running speed of the algorithm. Simulation experiments prove the effectiveness of the IKNN algorithm with higher precision and less calculation.
Year
DOI
Venue
2008
10.1109/ICNSC.2008.4525257
ICNSC
Keywords
Field
DocType
neural network,k nearest neighbor,simulation experiment
k-nearest neighbors algorithm,Training set,Computer science,Artificial intelligence,Artificial neural network,Cluster analysis,Machine learning,Built-in self-test
Conference
Volume
Issue
ISSN
null
04
null
ISBN
Citations 
PageRank 
978-1-4244-1686-8
1
0.38
References 
Authors
6
3
Name
Order
Citations
PageRank
Dongchao Ji110.38
Bifeng Song2139.70
Fei Han310.38