Name
Abstract | ||
|---|---|---|
Two sets of conditions are derived that make one- dimensional bilateral arrays of combinational cells testable for single faulty cells. The test sequences are preset and, in the worst case, grow quadratically with the size of the array. Conditions for testability in linear time are also derived. The basic cell can operate at the bit or at the word level. An implementation of FIR filters using (systolic) one-dimensional bilateral arrays of cells, which can be considered combinational at the word level, is presented as an example. A straightforward generalization for the two- dimensional case is made; a systolic array used for matrix multiplication is presented as an example for this case. |
Year | DOI | Venue |
|---|---|---|
1986 | 10.1109/TC.1986.1676653 | IEEE Trans. Computers |
Keywords | Field | DocType |
word level,combinational cells,bilateral arrays,one-dimensional bilateral array,dimensional case,systolic array,basic cell,dimensional bilateral array,matrix multiplication,worst case,testability conditions,linear time,combinational cells testable,quadratic growth,fault detection | Testability,Logical matrix,Fault detection and isolation,Computer science,Algorithm,Systolic array,Arithmetic,Multiplication,Finite impulse response,Time complexity,Matrix multiplication | Journal |
Volume | Issue | ISSN |
35 | 1 | 0018-9340 |
Citations | PageRank | References |
28 | 2.08 | 11 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Anastasios Vergis | 1 | 62 | 4.18 |
| Kenneth Steiglitz | 2 | 1128 | 660.13 |