Name
Abstract | ||
|---|---|---|
Due to fast technology scaling, negative bias temperature instability (NBTI) has become a major reliability concern in designing modern integrated circuits. In this paper, we present a simple and proactive NBTI recovery scheme targeting at critical and busy functional units with storage cells in modern microprocessors. Existing schemes have limitations when recovering these functional units. By exploiting the idle time of busy functional units at per-buffer-entry level, our scheme achieves on average 5.57x MTTF (Mean Time To Failure) improvement at the cost of <1% IPC degradation and <1% area overhead. |
Year | DOI | Venue |
|---|---|---|
2010 | 10.1109/DATE.2010.5457170 | DATE |
Keywords | Field | DocType |
functional units,ipc degradation,busy functional unit,major reliability concern,microprocessors,proactive nbti recovery scheme,microprocessor chips,proactive nbti mitigation,idle time,storage cells,fast technology scaling,functional unit,modern integrated circuit,modern microprocessors,mean time to failure,integrated circuit design,mean time,negative bias temperature instability,integrated circuit designing,mttf,out-of-order microprocessors,out of order,fpga,stress,registers,hidden markov models,hardware accelerator,bioinformatics,integrated circuit,degradation,reliability,threshold voltage,logic gates | Mean time between failures,Logic gate,Computer science,Field-programmable gate array,Real-time computing,Negative-bias temperature instability,Integrated circuit design,Hardware acceleration,Out-of-order execution,Integrated circuit,Embedded system | Conference |
ISSN | ISBN | Citations |
1530-1591 | 978-1-4244-7054-9 | 10 |
PageRank | References | Authors |
0.59 | 7 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Lin Li | 1 | 13 | 1.67 |
| Youtao Zhang | 2 | 1977 | 122.84 |
| Jun Yang | 3 | 366 | 22.63 |
| Zhao Jianhua | 4 | 327 | 44.13 |