Paper Info
Title
Electromagnetic Transient Faults Injection on a Hardware and a Software Implementations of AES
Abstract
This paper considers the use of electromagnetic pulses (EMP) to inject transient faults into the calculations of a hardware and a software AES. A pulse generator and a 500 um-diameter magnetic coil were used to inject the localized EMP disturbances without any physical contact with the target. EMP injections were performed against a software AES running on a CPU, and a hardware AES (with and without countermeasure) embedded in a FPGA. The purpose of this work was twofold: (a) reporting actual faults injection induced by EMPs in our targets and describing their main properties, (b) explaining the coupling mechanism between the antenna used to produce the EMP and the targeted circuit, which causes the faults. The obtained results revealed a localized effect of the EMP since the injected faults were found dependent on the spatial position of the antenna on top of the circuit's surface. The assumption that EMP faults are related to the violation of the target's timing constraints was also studied and ascertained thanks to the use of a countermeasure based on monitoring such timing violations.
Year
DOI
Venue
2012
10.1109/FDTC.2012.15
FDTC
Keywords
DocType
Citations 
emp fault,localized emp disturbance,electromagnetic transient faults injection,timing violation,localized effect,targeted circuit,software implementations,emp injection,timing constraint,hardware aes,software aes,actual faults injection,mcu,encryption,pulse generators,electromagnetic pulse,field programmable gate arrays,fpga,dfa,aes
Conference
47
PageRank 
References 
Authors
2.46
16
4
Name
Order
Citations
PageRank
Amine Dehbaoui11247.13
Jean-Max Dutertre231329.14
Bruno Robisson334422.03
Assia Tria429623.36