Paper Info
Title
HARDWARE FOR PRODUCTION TEST OF RFID INTERFACE EMBEDDED INTO CHIPS FOR SMART CARDS AND LABELS USED IN CONTACTLESS APPLICATIONS
Abstract
Application-oriented, production wafer test of theRFID interfaces embedded in VLSI devices such ascontactless applications for smart cards andidentification TAGs, falling in the frequency rangebelow 20 MHz, require a specific testing solution.There must be external circuitry on the probe cardwith limits of the parallel test to 1 to 3 devices. A testsolution embedded into standard ATE and capable oftesting up to 32 dies in parallel, without any externalcircuits will be discussed in this paper.
Year
DOI
Venue
2000
10.1109/TEST.2000.894241
ITC
Keywords
Field
DocType
contactless applications,frequency rangebelow,smart cards,andidentification tags,external circuitry,ascontactless application,production wafer test,labels used,vlsi device,parallel test,smart card,probe cardwith limit,rfid interface embedded,production test,specific testing solution,production,vlsi,frequency,embedded systems,chip,capacitance,automatic test equipment,hardware,voltage
Wafer,Capacitance,Automatic test equipment,Computer science,Voltage,Smart card,Electronic engineering,Probe card,Electronic circuit,Computer hardware,Very-large-scale integration,Embedded system
Conference
ISSN
ISBN
Citations 
1089-3539
0-7803-6546-1
0
PageRank 
References 
Authors
0.34
0
1
Name
Order
Citations
PageRank
Cristo da Costa100.34