Name
Abstract | ||
|---|---|---|
This article introduces a p-stage step-stress accelerated life test on n system products, where each system contains ms-independent non-identical components connected in series, and it fails if any component has broken down. Due to cost considerations or environmental restrictions, masked causes of system failures and type-I censored observations might occur in the collected data. The time to fail... |
Year | DOI | Venue |
|---|---|---|
2011 | 10.1109/TR.2011.2134270 | IEEE Transactions on Reliability |
Keywords | Field | DocType |
Stress,Maximum likelihood estimation,Life estimation,Mathematical model,Reliability,Computational modeling | Masking (art),Life test,Expectation–maximization algorithm,Cumulative Exposure,Weibull distribution,Maximum likelihood,Statistics,Mathematics,Reliability engineering | Journal |
Volume | Issue | ISSN |
60 | 3 | 0018-9529 |
Citations | PageRank | References |
11 | 1.09 | 7 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Tsai-Hung Fan | 1 | 56 | 9.30 |
| Wan-Lun Wang | 2 | 47 | 6.48 |