Transient Thermal Characteristics of VLSI Devices : Evaluation and Application - Citegraph

Paper Info

Title
Transient Thermal Characteristics of VLSI Devices : Evaluation and Application

Year	Venue	Field
1986	ITC	Thermal,Computer science,Electronic engineering,Very-large-scale integration
DocType	Citations	PageRank
Conference	0	0.34
References	Authors
0	2

Authors (2 rows)

Cited by (0 rows)

References (0 rows)

Name	Order	Citations	PageRank
M. Aghazadeh	1	0	0.34
M. Kirschner	2	0	0.34

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