Name
Year | Venue | Field |
|---|---|---|
2008 | South African Computer Journal | Feature selection,Naive Bayes classifier,Computer science,Word error rate,Multinomial distribution,Correlation,Artificial intelligence,Classifier (linguistics),Probability density function,Machine learning,Management science |
DocType | Volume | Citations |
Journal | 40 | 0 |
PageRank | References | Authors |
0.34 | 0 | 2 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Ewald van Dyk | 1 | 13 | 1.25 |
| Etienne Barnard | 2 | 438 | 57.85 |