Paper Info
Title
QBIST: Quantum Built-in Self-Test for any Boolean Circuit
Abstract
Recently, a systematic procedure was proposed to derive a minimum space quantum circuit for any given classical logic with the generalized quantum Toffoli gate which is universal in boolean logic. Since quantum computation is reversible, we can apply this property to build quantum iterative logic array (QILA). QILA can be easily tested in constant time (C-testable) if stuck-at fault model is assumed. In this paper, we use Hadamard and general CCN gates to make QILA 1-testable. That is, for any quantum boolean circuit, the number of test patterns is independent of both the size of the array and the length of the inputs. This property can be applied to perform the quantum built-in self-test (QBIST), which makes any boolean circuit 1-testable.
Year
DOI
Venue
2008
10.1109/VTS.2008.49
VTS
Keywords
Field
DocType
classical logic,quantum built-in self-test,quantum boolean circuit,boolean logic,generalized quantum toffoli gate,qila 1-testable,quantum iterative logic array,quantum computation,boolean circuit,boolean circuit 1-testable,minimum space quantum circuit,boolean circuits,fault model,hadamard,quantum computing,transistors,logic gates,quantum gates,quantum computer,testing,boolean functions
Quantum circuit,Boolean circuit,Quantum gate,Computer science,Electronic engineering,Quantum algorithm,Quantum information,Quantum error correction,Quantum network,Toffoli gate
Conference
ISSN
ISBN
Citations 
1093-0167
0-7695-3123-7
0
PageRank 
References 
Authors
0.34
7
3
Name
Order
Citations
PageRank
Yao-Hsin Chou115124.63
Sy-Yen Kuo22304245.46
I-Ming Tsai3414.43