Title
Assessing Software Product Line Testing Via Model-Based Mutation: An Application to Similarity Testing
Abstract
Needs for mass customization and economies of scale have pushed engineers to develop Software Product Lines (SPLs). SPLs are families of products sharing commonalities and exhibiting differences, built by reusing software assets abstractly represented by features. Feature models describe the constraints that link the features and allow the configuration of tailored software products. Common SPLs involve hundreds, even thousands of features, leading to billions of possible software products. As a result, testing a product line is challenging due to the enormous size of the possible products. Existing techniques focus on testing based on the product line's feature model by selecting a limited set of products to test. Being created manually or reverse-engineered, feature models are prone to errors impacting the generated test suites. In this paper, we examine ability of test suites to detect such errors. In particular, we propose two mutation operators to derive erroneous feature models (mutants) from an original feature model and assess the capability of the generated original test suite to kill the mutants. Experimentation on real feature models demonstrate that dissimilar tests suites have a higher mutant detection ability than similar ones, thus validating the relevance of similarity-driven product line testing.
Year
DOI
Venue
2013
10.1109/ICSTW.2013.30
ICST Workshops
Keywords
Field
DocType
assessing software product line,product line,possible product,testing via model-based mutation,real feature model,similarity testing,feature model,common spls,possible software product,test suite,erroneous feature model,original feature model,original test suite,frequency modulation,similarity,mass customization,economies of scale,mutation,testing
Test suite,Data mining,Regression testing,White-box testing,Software performance testing,Feature model,Model-based testing,Software product line,Engineering,Software construction,Reliability engineering
Conference
ISSN
Citations 
PageRank 
2159-4848
40
0.94
References 
Authors
23
5
Name
Order
Citations
PageRank
Christopher Henard138310.88
Mike Papadakis2111452.77
Gilles Perrouin372937.37
Jacques Klein42498112.20
Yves Le Traon53922190.39