Title
Maximal margin classification for metric spaces
Abstract
In order to apply the maximum margin method in arbitrary metric spaces, we suggest to embed the metric space into a Banach or Hilbert space and to perform linear classification in this space. We propose several embeddings and recall that an isometric embedding in a Banach space is always possible while an isometric embedding in a Hilbert space is only possible for certain metric spaces. As a result, we obtain a general maximum margin classification algorithm for arbitrary metric spaces (whose solution is approximated by an algorithm of Graepel et al. (International Conference on Artificial Neural Networks 1999, pp. 304-309)). Interestingly enough, the embedding approach, when applied to a metric which can be embedded into a Hilbert space, yields the support vector machine (SVM) algorithm, which emphasizes the fact that its solution depends on the metric and not on the kernel. Furthermore, we give upper bounds of the capacity of the function classes corresponding to both embeddings in terms of Rademacher averages. Finally, we compare the capacities of these function classes directly.
Year
DOI
Venue
2005
10.1016/j.jcss.2004.10.013
Journal of Computer and System Sciences
Keywords
DocType
Volume
maximum margin,arbitrary metric space,function class,hilbert space,pattern recognition. pacs:,metric spaces,general maximum margin classification,isometric embedding,embedding,linear classification,pattern recognition,classification,banach space,certain metric space,embedding approach,metric space,maximal margin classification,support vector machine
Journal
71
Issue
ISSN
Citations 
3
Journal of Computer and System Sciences
28
PageRank 
References 
Authors
4.82
3
3
Name
Order
Citations
PageRank
Matthias Hein166362.80
Olivier Bousquet24593359.65
Bernhard Schölkopf3231203091.82