Name
Title | ||
|---|---|---|
Detecting Inclusions in Electrical Impedance Tomography Without Reference Measurements |
Abstract | ||
|---|---|---|
We develop a new variant of the factorization method that can be used to detect inclusions in electrical impedance tomography from either absolute current-to-voltage measurements at a single, nonzero frequency or from frequency-difference measurements. This eliminates the need for numerically simulated reference measurements at an inclusion-free body and thus greatly improves the method's robustness against forward modeling errors, e. g., in the assumed body's shape. |
Year | DOI | Venue |
|---|---|---|
2009 | 10.1137/08072142X | SIAM JOURNAL ON APPLIED MATHEMATICS |
Keywords | Field | DocType |
inverse problems,electrical impedance tomography,complex conductivity,frequency-difference measurements,factorization method | Factorization method,Mathematical optimization,Mathematical analysis,Robustness (computer science),Inverse problem,Mathematics,Electrical impedance tomography | Journal |
Volume | Issue | ISSN |
69 | 6 | 0036-1399 |
Citations | PageRank | References |
11 | 0.90 | 10 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Bastian Harrach | 1 | 28 | 5.21 |
| Jin Keun Seo | 2 | 376 | 58.65 |