Name
Year | Venue | Keywords |
|---|---|---|
1999 | ISMB | pattern recognition,electron density,x ray crystallography |
Field | DocType | ISBN |
Electron density,Computer science,Euclidean distance,Bioinformatics,Pattern recognition system | Conference | 1-57735-083-9 |
Citations | PageRank | References |
2 | 0.54 | 1 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Thomas R. Ioerger | 1 | 623 | 59.10 |
| Thomas Holton | 2 | 6 | 2.47 |
| Jon A. Christopher | 3 | 14 | 2.31 |
| James C. Sacchettini | 4 | 31 | 7.83 |