Paper Info
Title
Increasing Manufacturing Yield for Wideband RF CMOS LNAs in the Presence of Process Variations
Abstract
In this paper, the authors develop several design techniques for reducing the impact of manufacturing variations on integrated wideband low noise amplifiers (LNA). Utilizing an efficient modeling and automated design methodology, the authors investigate the sensitivity of LNA performance metrics to process variations and determine that the input impedance matching is particularly sensitive to perturbations in component values. Based on the sensitivity analysis, the authors leverage several design techniques to increase the reliability of LNA designs. To mitigate the impact of process variations on the input impedance matching, the authors add additional circuit elements and tunable capacitors to dynamically compensate for manufacturing variations after fabrication. The results indicate that the proposed design techniques can increase manufacturing yield by up to one order of magnitude for input impedance matching with only a 14% increase in noise figure
Year
DOI
Venue
2007
10.1109/ISQED.2007.89
San Jose, CA
Keywords
Field
DocType
input impedance,process variations,integrated wideband low noise,process variation,design technique,automated design methodology,manufacturing yield,noise figure,lna performance metrics,proposed design technique,lna design,input impedance matching,wideband rf cmos lnas,impedance matching,radio frequency,noise reduction,low noise amplifier,reliability,cmos integrated circuits,sensitivity analysis
Wideband,Capacitor,Computer science,Impedance matching,Noise figure,Electronic engineering,CMOS,Electrical element,Input impedance,Electrical engineering,Amplifier
Conference
ISBN
Citations 
PageRank 
0-7695-2795-7
19
1.08
References 
Authors
12
4
Name
Order
Citations
PageRank
Arthur Nieuwoudt120720.59
Tamer Ragheb226618.65
Hamid Nejati3687.04
Yehia Massoud4772113.05