Name
Abstract | ||
|---|---|---|
We present a prototype system for in-situ measurement of per-pixel appearance parameters (i.e., surface orientation, diffuse albedo, specular albedo, and specular roughness) of general scenes. The proposed system requires no specialized hardware, is light weight, and requires no on-site calibration. This makes our system particularly well suited for capturing the appearance of real-world scenes under uncontrolled conditions. |
Year | DOI | Venue |
|---|---|---|
2010 | 10.1145/1899950.1899971 | SIGGRAPH ASIA (Sketches) |
Keywords | Field | DocType |
general scene,spherical illumination reflectometry,in-situ measurement,diffuse albedo,prototype system,per-pixel appearance parameter,specular roughness,proposed system,on-site calibration,specular albedo,light weight | Computer vision,Computer graphics (images),Computer science,Specular reflection,Albedo,Artificial intelligence,Surface finish,Reflectometry,Texture transfer,Free form,Calibration | Conference |
Citations | PageRank | References |
1 | 0.48 | 4 |
Authors | ||
5 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Kaori Kikuchi | 1 | 3 | 1.30 |
| Bruce Lamond | 2 | 110 | 5.02 |
| Abhijeet Ghosh | 3 | 772 | 58.87 |
| Pieter Peers | 4 | 1109 | 55.34 |
| Paul Debevec | 5 | 4955 | 449.10 |