Name
Abstract | ||
|---|---|---|
Test compression / decompression is an efficient method for reducing the test application cost. In this letter we propose a response compression method based on Huffman coding. The proposed method guarantees zero-aliasing and it is independent of the fault model and the structure of a circuit-under-test. Experimental results of the compression ratio and the size of the encoder for the proposed method are presented. |
Year | DOI | Venue |
|---|---|---|
2005 | 10.1093/ietisy/E88-D.1.158 | IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS |
Keywords | Field | DocType |
Huffman code, test compression, test response, test application time, ATE | Computer science,Algorithm,Coding (social sciences),Chip,Huffman coding,Encoder,Test compression,Very-large-scale integration,Fault model,Test set | Journal |
Volume | Issue | ISSN |
E88D | 1 | 1745-1361 |
Citations | PageRank | References |
0 | 0.34 | 7 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Hideyuki Ichihara | 1 | 96 | 18.92 |
| Michihiro Shintani | 2 | 32 | 12.55 |
| Tomoo Inoue | 3 | 352 | 47.23 |